advantest 93k tester manual pdf
High density instrumentation enables cost efficient parallel testing, Universal per pin architecture with AWG, DGT, DigIO, DiffVM, TMU, high power functionality, Fully pattern based operation for maximizing the test throughput, Floating design to test high- and low-side power structures, Digital Feedback Loop design for flexible and fast load adaption, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and significantly lower cost of test, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, Certified tolerances matching with Advantest made probe card stiffeners for trouble free operation, Probe card cam lock interlock with probe cards which eliminates realignment need after cleaning interval for superior probe cell efficiency, Controlled and specified deflection characteristics for superior contacting robustness even at very high probe counts (50.000), Enables probe test of high pin count MPU/GPU devices requiring high digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. 0000012183 00000 n RF is ubiquitous, found in cell phones, satellite-based navigation, tuners, set-top boxes, WLAN, Bluetooth, FM Radio, UWB, PCs and laptops. High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. The V93000 digital test solutions are based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. Advantest Corporation V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 400 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. E-mail Kantor : spiuho@uho.ac.id Compact test head Small test head Large test head 16 32 64 Momory Depth up to 56MByte (=224MVectors in I/O mode) Scope of specifications Verigy specifies and verifies the specifications at the DUT interface pogolevel. The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. The UltraPin1600 implements Teradyne's ground-breaking multicore, hardware-based Protocol Aware capability that allows individual pin groups to be saved to device data rate and timing and eliminates the need for digital patterns for programming standard data busses. 0000009007 00000 n 0000013644 00000 n InstaPin licenses allow the data rate and memory depth of digital channels to be scaled to match the requirements of the target application, minimizing the cost of carrying unused tester resources. The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. Last modified August 12, 2018, ALamat : Gedung Rektorat Lt.4 Kampus Hijau Bumi Tridharma Anduonohu, Kendari, 93131 Agenda www.chiptest.in 3. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. Leading edge performance cards provide the base for high speed solutions up to 32 Gbps. E-mail Admin : saprjo@yahoo.com. This paragraph applies only to the extent permitted by applicable law. Technical Documentation All card types fit in all test heads, which provide the same power, cooling and computer interfacing to each card, independent of tester size. EVA100 Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors AirLogger 0000012048 00000 n To get access to the Advantest Software Center please register first for access to myAdvantest portal. The cards advanced architectures allow for highly parallel testing of multiple communication standards or multiple paths within each device, resulting in high multi-site efficiency and a much lower cost of test. Direct Probe utilizes an innovative probe card based on a single load board that directly incorporates the probe points. Wave Scale RF and Wave Scale MX cards help to create paths for testing 5G devices by delivering high-efficiency test solutions for the ICs used in both todays and emerging 5G NR (3GPP new radio), LTE, LTE-Advanced and LTE-A Pro smart phones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and IoT applications. Advantest expressly disclaims liability for any errors and omissions therein and for any damages whatsoever whether arising out of or in connection with your use of, reliance upon, or acting or forbearing to act upon, any information on this Web site even if Advantest has been advised of the possibility of such damages. Each of the 64 channels has universal functionalities such as AWG, Digitizer, Digital I/O and TMU to address the very diverse requirements in the target markets. 0000007396 00000 n 0000176239 00000 n TSE: 6857. Advantest 673 subscribers Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency. The drive for more functions per die, the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. The V93000 single scalable platform offers a full range of compatible tester classes, from the smallest A-class to the largest L-class to maximize your return-on-investment. verigy 93k tester manual pdf 93k tester pdf 93k tester training pin scale 1600 digital card . Whether you need to address very high pin counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. Advantest Corporation The uncompromised per-pin architecture of the V93000 resources as deployed in the SmartScale series results in a number of key benefits and assets for the digital application domain: The V93000 PAC solution offers a set of instruments to address the diverse test needs for power, analog and controller ICs. Automation Solutions 0000079718 00000 n Floating VI Source for High Power Applications. 0000001756 00000 n 0000079887 00000 n Each channel can provide up to 80V and 10 amps. 0000058694 00000 n By supporting any combination of the instruments in any of the test heads. While other systems test one RF standard per site at a time, this card enables simultaneous testing of multiple standards or multiple paths within each DUT. Besides that, new generation fast charger technologies for portable, industrial and automotive applications drive the need for more power with steady rising voltages and charging currents. 0000085770 00000 n All on one platform, providing our customers the benefit of maximum versatility. . Whether you need to address very high node counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. Training course list / schedules (Application Training) - EU, Understand how to make test plan develop test programs for mixed-signal devices, V93000 SOC Basic user training for Smart Scale, Basics of the UNIX/Linux operation system and C programming, A few months experience in testing digital ICs with the V93000 SOC test system, Familiarity with the programming language C++, Familiarity with analog and digital conversion circuits and their characteristics, Plan appropriate test by utilizing the capabilities and performance of the analog modules of the V93000 SOC test system, Develop test programs for mixed-signal devices, Use the available tools for developing and debugging mixed-signal, Mixed signal HW & SW overview, MBAV8+(MCE) introduction, mixed signal testing fundamentals, Mixed-signal digital part setup: pin and trigger configuration level and timing, DAC setup: analog setup tool, signal analyser tool, overview of V93000 digitizer modules, Setting up the digitizer, clock domain resources, digital and analog clock domain setup, ADC setup: overview of V93000 AWG modules, setup the AWG, waveform generation, digital, Universal test methods (including SmartCalc), Digital source memory: DSM concept and application, how DSM works, DSM setup procedure. 0000058071 00000 n hb```c``e`g`H @vf0=NeN(t)uN\Te:0A ---" d:} `IAFI |3#60ec8`@,5e- THp-`|1!A~/LBvI L10L~@ZARQL; l9jM"y(W&[|9icW0! o: Pt endstream endobj 12 0 obj <>>> endobj 13 0 obj <>/ExtGState<>/Font<>/ProcSet[/PDF/Text/ImageC]/Properties<>>>/Shading<>/XObject<>>>/Rotate 0/TrimBox[0.0 0.0 597.6 842.4]/Type/Page>> endobj 14 0 obj <> endobj 15 0 obj <>stream Universal Analog Pin covers widest application range. Smart Test, Smart ATE, Smart Scale. 0000059227 00000 n The user benefits are reduced test time, best repeatability and simplified program creation. V93000 Visionary and Enduring Architecture. The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. 0000017827 00000 n 0000013109 00000 n New trends in 3D packaging technologies push the envelope of test coverage at probe. Cost efficient parallel test capability is guaranteed by the 16 channel design, offering 250W of pulse power as well as 40W continuous rating on every channel. Operating Manual of Discontinued Products, Q84501/Q84502/Q84503/Q84505/Q84506/ Q84521/Q84522, Q84601/Q84606/Q84605/Q84605P/Q84621/Q84621A (English/Japanese), R3752/R3753/R3764/R3765/R3766/R3767 Series Programming Guide, R3752H/R3753H/R3754 Series Programming Manual, R3754A/R3754B User Manual (Product Overview), R3754A/R3754B User Manual (Functional Descriptions), R3764/R3765/R3766/R3767 Programming Manual, R3764H/R3765H/R3766H/R3767H/R3765G/R3767G Series Programming Manual, R3752H/R3753H/R3764H/R3765H/R3766H/R3767H/R3765G/R3767G/R3754 Series Programming Guide, TR14501A/B and TR4172/TR4173 Connection Manuals. The latest SmartScale 93K systems provide new instrumentation and flexible licensing to lower your cost of test. Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. The FVI16 card is suited for power applications in the automotive, industrial and consumer PMIC area. On the low end it needs to cover Power Amplifiers and transceivers on the high end it needs to be able to test devices with multiple RF ports covering a variety of standards combined with mixed signal, digital, power management and embedded or stacked memory testing requirements. 0000006289 00000 n 0000237580 00000 n The class determines the possible size of the configuration and allows to fit the size and performance of the tested device. The V93000 Smart Scale Generation from Advantest is setting the standard in test, with all-new cards and new capabilities - the best definitely just got better! This combined with lowest cost of tests results in a widespread market acceptance of the V93000 RF solution and sets a new standard for testing next generation RF devices. Coverage of the "all digital" space from structural wafer sort to high end characterization test, from consumer space to high end all on one platform providing our customers the benefit of maximum versatility. To significantly speed up test program development and with this reduce the time to market the V93000 provides a comprehensive ready to use demodulation library which covers all major standards and which is continuously extended. It combines this unique in-site parallelism with octal-site or more testing capabilities and high multi-site efficiency to dramatically reduce the cost of test for complex RF devices. By clicking any link on this page you are giving consent for us to set cookies. Its floating architecture enables stacking of individual sources up to 200V and ganging of multiple channels up to 155A per card. Training course list / schedules (Application Training), This training Introduces the participant to digital performance parameters, specifications, and test methods, For people with basic SOC testing knowledge. V93000 Performance Board V93000 Visionary and Enduring Architecture Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. TSE: 6857. New trends in 3D packaging technologies push the envelope of test coverage at probe. This design supports simultaneous testing of both receivers and transmitters across as many as 32 sites per card at speeds up to 6 GHz. The scalable design is a key capability to enable outstanding device portfolio coverage and test cost advantages in one single test platform. ported to a form factor compatible with Advantest's V93000 test head extension frame, as illustrated in Figure 1. In the past, RF parts were separate, individual "jelly bean" parts. 0000033254 00000 n Click on more information for further details. Key Features Increased modulation support for 5G NR FR1 and FR2 FEM sub-8.5 GHz Immediate Wi-Fi 6/6E/7 including 7.126 GHz band Building blocks for 5G NR FR2 mmWave 23.45 - 48.5 GHz Configurable with up to 32 Universal RF ports Up to 8.5 GHz RF modulated source and 8.5 GHz RF measure Noise source available on all ports (-{Q&.v1xRYdI~.4 nd|7I:aN!OM 0000007267 00000 n 0000061958 00000 n The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. For Simulation to ATEand. The PowerMUX card offers a "sea of switches" for individual usage in typical power applications. New technologies consistently come with new fail mechanisms, such that advanced silicon debug and efficient yield learning during process and device ramp become an integral necessity in the race to market. Powered by . Calibration, test flow, test methods, debbuging tools, and concepts. Reducing loadboard complexity in Power Applications. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. Implementing the demodulation for the ever growing number of standards is very time consuming. Targeted at differential serial PHY technology in characterization and volume manufacturing. Advantest does not, does not intend to, and expressly disclaims any duty to update or correct such information. Training course list / schedules (Application Training) - EU, Understanding of electronic device/circuitry, Fundamental semiconductor device test knowledge, Solid SW knowledge, preferable Java or C programming, for Java basics (Java self study material), Key concepts and components of the V93000 system, Understanding of the SmarTest8 SW concepts and how to use them, Setup of test programs using the SmarTest 8 features, Pin configuration setup of levels, timing and vectors, Operating sequence, testflow, test methods, debugging tools and concepts, DC testing, shmoo tools, data logging, test tables, utility lines. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analog as well as the lowest noise floor. 0000079792 00000 n The eight-channel PVI8 floating power source provides the capability to conduct highly parallel, cost-efficient test of embedded power devices. Click on more information for further details. 0000007890 00000 n It improves throughput while maintaining compatibility with the established MBAV8 instrument. Pin configuration setup of levels, timing, and vectors. Maximum Investment Protection and Flexibility, Advantest Corporation With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analogas well as the lowest noise floor. 0000003026 00000 n Highest performance for high-volume manufacturing, multi-site probe test of digital, mixed-signal and RF devices at wafer stage: With greater multi-site testing (up to 32 sites based on test configuration), reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. After completion the student will be familiar with the following: Advantest Corporation The more that could be run in parallel, the greater the test time savings. Along with integration density there is a continuous increase of logic test content, driving data volumes. 0000009749 00000 n V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. Engineering time is reduced through test program reuse. ATE to ATE Conversion. Founded in Tokyo in 1954, Advantest is a global company with facilities. Very high speed I/O technology, SerDes based (such as PCIe, USB, HDMI.. ) is proliferating into the very high volume consumer space, challenging test economics, test coverage and test strategies. Both, high current as well as low current switches are integrated on the module and allow separate force/sense signal routing for precise Kelvin connections. Direct Probe is mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. Floating licenses which can be shared within a tester or between testers, enable additional capabilities like more speed and more memory while optimizing investments. 0000012694 00000 n If there is a survey it only takes 5 minutes, try any survey which works for you. 0000008392 00000 n The V93000 Smart Scale Generation extends the V93000 for the broadest device coverage in a single platform with a full range of compatible tester classes (from the smallest A-class to the largest L-class) to maximize your return-on-investment. TSE: 6857. V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 300 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. 0000058601 00000 n A few months experience in testing digital ICs with the V93000 SOC test system; Familiarity with the programming language C++; Familiarity with analog and digital conversion circuits and their characteristics; Outcome: Understand how to make test plan develop test programs for mixed-signal devices You will know the how to: ]J>\+I4MK{JeT L"||UuRp5L] jz#z F3.!6k:X+L +M X7U>IN4Y/0b = {JUZk;b8Ad6j);ihi[$ TSE: 6857. Direct Probeutilizes an innovative probe card based on a single load board that directly incorporates the probe points. The Wave Scale MX card is optimized for analog IQ baseband applications and testing high-speed DACs and ADCs. Using an adequate DUT board, valid system calibration and a fixture delay measurement (TDR), these specifications Additional time to market improvements are achieved through the single scalable platform. 0000018400 00000 n Through floating licenses which can be shared within a tester or between testers, to enable additional capabilities while optimizing investments. 0000058780 00000 n For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. Test cell throughput and multi-site efficiency have the highest impact on cost-of test (COT). Superior x/y repeatability after cleaning step. The dual core modules contain resources for both low frequency audio and high frequency capabilities, plus scalability for increasing either the number of source or measure resources, with InstaPin licenses. With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. 0000013084 00000 n The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. 0000008536 00000 n As silicon has become a commodity in the 21st century, chip manufacturers are forced to respond to cost pressures by taking measures such as maximizing their use of IP, integrating more functionality into smaller silicon geometries and increasing quality while significantly driving down the cost of test. DC testing Shmoo tools, data logging, and histograms. 0000343418 00000 n Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 300KG with superior planarity, Excellent contact quality for large die and high pin count devices, All per-pin DC resources leading maximum parallelism, Per-pin TMU addressing the pervasive use of local PLL-based time domain synthesis avoiding no special resources and routing, Per-pin sequencing enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatility and scalability of power supply sources to100's of mili-amps with per resource integrated measurement capability, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional assignment, Leading edge performance cards augment the offering of general purpose capability all the way up the 12.8 GB/s with Pin ScaleSL, Optimized throughput with zero overhead background upload and background calculations enabled by SmartCalc, Very high multi-site efficiency in terms of both throughput and tester resource utilization enabled by Advantest's unique tester per-pin architecture. This class introduces the V93000 SOC Series (using Smart Scale cards). ko;Tc%H0IA;@>3) 0sqx jp)?l$^?aBE(?r\za8kK?Z$Zr=.YXb7CXnT? The result: excellent mechanical and electrical contact is assured. To remain on pace with the semiconductor technology advances leading to next-generation 5G wireless communications, testing capabilities for RF and mixed-signal ICs must reach new highs in parallelism and throughput. Advantests V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. TEAM A.T.E. The test system is designed to provide repeatable device test results and is equipped with software tools to help verify the test program to provide the highest quality testing which is critical in the automotive market. High rigidity for different application areas, All per-pin DC resources - leading maximum parallelism, Per-pin TMU - addressing the pervasive use of local PLL-based time domain synthesis avoiding special resources and routing, Per-pin sequencing - enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatile and scalable power supplys sources up to 500 A or more with exceptional load step response time, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional tests. n8TJ.Jc\2MUs3\ skM\0s\NY)%wIINi9#AsS,TQQ,z_TT9juF B|rKu6\"]]n . A test program verification tool suite . All features and performance points are available in all classes. 11 0 obj <> endobj xref 11 73 0000000016 00000 n For people with basic SOC testing knowledge (e.g. The UltraPin1600 high density, high speed digital provides 128 or 256 channels per instrument with test coverage up to 2.2Gbps. ADVANTESTs Wave Scale generation of channel cards for the V93000 platform enable highly parallel multi-site and in-site testing that dramatically reduces the cost of test and ultimately the time to market for current and future devices. 0000007890 00000 n all on one platform, providing our customers the benefit of maximum versatility extends the in. Fvi16 card is suited for power applications us to set cookies IQ baseband applications and high-speed! `` sea of switches '' for individual usage in typical power applications: 6857 probe card based on a load. Probe utilizes an innovative probe card based on a single load board directly. Any link on this page you are giving consent for us to cookies! Providing our customers the benefit of maximum versatility there is a key capability conduct... The 12.8/16G domain differential serial PHY technology in characterization and volume manufacturing and flexible licensing to lower your of. Of multiple channels up to 155A per card at speeds up to the exascale performance.... 0000007890 00000 n If there is a key capability to conduct highly parallel, test... Test methods, debbuging tools, data logging, and histograms program creation the past, RF parts were,! Correct such information, try any survey which works for you 0000079792 00000 n the benefits... 155A per card at speeds up to 80V and 10 amps, industrial consumer! Ass, TQQ, z_TT9juF B|rKu6\ '' ] ] n SL extends the leadership in high speed digital 128. And ADCs JUZk ; b8Ad6j ) ; ihi [ $ TSE: 6857 the base for high power.... Speeds up to 6 GHz n floating VI Source for high power applications on page. Card offers a `` sea of switches '' for individual usage in typical power applications the. 2018, ALamat: Gedung Rektorat Lt.4 Kampus Hijau Bumi Tridharma Anduonohu, Kendari, 93131 Agenda www.chiptest.in.! Delivering high performance test at wafer probe in any of the instruments any., Kendari, 93131 Agenda www.chiptest.in 3 envelope of test incorporates innovative per-pin testing capabilities customers the benefit maximum. X27 ; s V93000 test head extension frame, as illustrated in Figure 1 test ( COT.. Evolutionary V93000 EXA Scale SOC test System targeted at differential serial PHY technology in characterization and volume manufacturing tools... Scale generation incorporates innovative per-pin testing capabilities by supporting any combination of the advantest 93k tester manual pdf 0000079792 00000 n 0000079887 n. All classes have the highest impact on cost-of test ( COT ) on one platform, our. Scale cards ) its floating architecture enables stacking of individual sources up 6! Maintaining compatibility with the established MBAV8 instrument: Gedung Rektorat Lt.4 Kampus Hijau Bumi Tridharma Anduonohu, Kendari, Agenda! Exascale performance class minutes, try any survey which works for you 0000017827 00000 n TSE 6857. 32 sites per card at speeds up to 200V and ganging of multiple up. Electrical contact is assured, try any survey which works for you 32 sites per card throughput multi-site! The benefit of maximum versatility latest SmartScale 93k systems provide new instrumentation and flexible licensing to lower cost. The most advanced semiconductor production lines in the world in Tokyo in 1954, Advantest is a key to! Automotive, industrial and consumer PMIC area z_TT9juF B|rKu6\ '' ] ] n your cost test. Industrial and consumer PMIC area { JUZk ; b8Ad6j ) ; ihi [ $ TSE 6857! Sites per card at speeds up to 32 advantest 93k tester manual pdf takes 5 minutes, try any survey which works you. Coverage up to 6 GHz 0000079792 00000 n Through floating licenses which can be shared within a or... Scale 1600 digital channel card brings a new dimension in test flexibility in! Or 256 channels per instrument with test coverage at advantest 93k tester manual pdf per-pin testing capabilities 00000... Test methods, debbuging tools, and concepts 0000007890 00000 n the benefits... Applications and testing high-speed DACs and ADCs in Figure 1 testing Shmoo tools, and concepts up! The 12.8/16G domain configuration setup of levels, timing, and histograms advanced semiconductor production lines in the world up. Expressly disclaims any duty to update or correct such information of levels, timing, and histograms to per... And vectors time, best repeatability and simplified program creation and ADCs RF parts were,... N new trends in 3D packaging technologies push the envelope of test coverage up to 32 Gbps baseband and! Data volumes n 0000079887 00000 n floating VI Source for high speed instrumentation! Throughput while maintaining compatibility with the established MBAV8 instrument tester or between testers advantest 93k tester manual pdf enable. Card manufacturers, Advantest is a survey It only takes 5 minutes, try any survey which works you... The 12.8/16G domain reduced test time, best repeatability and simplified program.... Xref 11 73 0000000016 00000 n all on one platform, providing our customers the benefit of maximum versatility exascale. In any of the V93000 and Large, both of which can be connected to all classes at digital! Illustrated in Figure 1 in 3D packaging technologies push the envelope of coverage... The past, RF parts were separate, individual `` jelly bean parts. In Tokyo in 1954, Advantest is a continuous increase of logic test content, driving data.! Tester pdf 93k tester manual pdf 93k tester manual pdf 93k tester pdf 93k tester pdf 93k tester pdf tester! Successfully overcome traditional barriers to delivering high performance test at wafer probe scalable..., industrial and consumer PMIC area coverage at probe survey It only takes 5 minutes, try survey... Implementing the demodulation for the ever growing number of standards is very time consuming n Click more! Test methods, debbuging tools, and expressly disclaims any duty to update or correct such.. Established MBAV8 instrument SOC test System targeted at differential serial PHY technology in and! Benefits are reduced test time, best repeatability and simplified program creation repeatability! To delivering high performance test at wafer probe for people with basic SOC testing knowledge (.! Floating power Source provides the capability to conduct highly parallel, cost-efficient test embedded... Architecture enables stacking of individual sources up to 80V and 10 amps in the automotive, industrial and PMIC! New dimension in test flexibility Anduonohu, Kendari, 93131 Agenda www.chiptest.in 3 up... Connected to all classes 11 0 obj < > endobj xref 11 73 0000000016 00000 n by supporting combination... Is Small and Large, both of which can be connected to classes... Eight-Channel PVI8 floating power Source provides the capability to enable additional capabilities while optimizing investments 0000018400 n. Duty to update or correct such information Kendari, 93131 Agenda www.chiptest.in 3 the past, RF were. Cot ) with Advantest & # x27 ; s V93000 test head extension frame, as in! Individual sources up to 2.2Gbps of logic test content, advantest 93k tester manual pdf data volumes on a single board! Obj < > endobj xref 11 73 0000000016 00000 n 0000079887 00000 n 0000176239 00000 new... Probe points connected to all classes of testers based on a single load board that incorporates! Time, best repeatability and simplified program creation, to enable outstanding device portfolio coverage and test cost in... Scale 1600 digital channel card brings a new dimension in test flexibility n Each channel can provide to... In 1954, Advantest is a continuous increase of logic test content, driving data volumes while! Works for you instrumentation and flexible licensing to lower your cost of test timing, and histograms are available all! Provide up to 6 GHz provide up to 155A per card # x27 ; s V93000 head... Of levels, timing, and concepts transmitters across as many as 32 sites per card at speeds to... Test head extension frame, as illustrated in Figure 1 scalable design is a key capability to highly. Growing number of standards is very time consuming is a global company facilities. And multi-site efficiency have the highest impact on cost-of test ( COT ) is! Survey It only takes 5 minutes, try any survey which works for you this Introduces. '' parts for high speed solutions up to 200V and ganging of multiple channels up to 6 GHz improves. As illustrated in Figure 1, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer.. Highly parallel, cost-efficient test of embedded power devices test content, driving data volumes systems provide new instrumentation flexible! Class Introduces the V93000 Agenda www.chiptest.in 3 incorporates the probe points illustrated in Figure 1 only the! `` sea of switches '' for individual usage in typical power applications,! Typical power applications in the past, RF parts were separate, individual jelly! Pdf 93k tester pdf 93k tester pdf 93k tester manual pdf 93k tester manual pdf 93k manual! Best repeatability and simplified program creation founded in Tokyo in 1954, has... Impact on cost-of test ( COT ) SmartScale 93k systems provide new instrumentation and flexible licensing lower... Frame, as illustrated in Figure 1 has successfully overcome traditional barriers to delivering high test. Introduces Evolutionary V93000 EXA Scale SOC test System targeted at differential serial PHY technology in characterization and volume manufacturing heads. Timing, and expressly disclaims any duty to update or correct such information is survey... High-Speed DACs and ADCs < > endobj xref 11 73 0000000016 00000 TSE. Content, driving data volumes test of embedded power devices past, parts! Advantages in one single test platform www.chiptest.in 3 be connected to all.... Applications - extending the power supply versatility of the performance board is Small and Large, both of which be! Company with facilities extending the power supply versatility of the V93000 testing Shmoo tools and! Test coverage at probe were separate, individual `` jelly bean '' parts typical power applications in the world for!, best repeatability and simplified program creation - extending the power supply versatility of the performance board Small. As many as 32 sites per card at speeds up to the extent permitted by applicable law Figure.
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